Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F20%3A39916393" target="_blank" >RIV/00216275:25310/20:39916393 - isvavai.cz</a>
Alternative codes found
RIV/00216305:26620/20:PU139943
Result on the web
<a href="https://avs.scitation.org/doi/full/10.1116/6.0000354" target="_blank" >https://avs.scitation.org/doi/full/10.1116/6.0000354</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1116/6.0000354" target="_blank" >10.1116/6.0000354</a>

Result language
angličtina
Original language name
Molybdenum diselenide thin films grown by atomic layer deposition: An XPS analysis
Original language description
Molybdenum diselenide (MoSe2) thin films were deposited on annealed titanium foils by atomic layer deposition using suitable precursors. In this paper, a detailed x-ray photoelectron spectroscopy analysis of the MoSe2 film is presented. Survey spectra, Mo 3d, Se 3d, Mo 3p, Se LMM, Se 3p, C 1s, and Se 4s core level along with the valence band spectra were measured. Quantitative analysis indicates a surface composition of MoSe1.8, suggesting a deficiency of selenium on the surface.
Czech name
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Czech description
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Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20506 - Coating and films

Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2020
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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