Atomic layer deposition and characterization of Bi1Se1 thin films
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25310%2F23%3A39920350" target="_blank" >RIV/00216275:25310/23:39920350 - isvavai.cz</a>
Result on the web
<a href="https://www.sciencedirect.com/science/article/pii/S0955221923003035" target="_blank" >https://www.sciencedirect.com/science/article/pii/S0955221923003035</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1016/j.jeurceramsoc.2023.04.026" target="_blank" >10.1016/j.jeurceramsoc.2023.04.026</a>
Alternative languages
Result language
angličtina
Original language name
Atomic layer deposition and characterization of Bi1Se1 thin films
Original language description
Van der Waals (vdWs) heterostructured materials have attracted considerable interest due to their intriguing physical properties. Here, we report on the deposition of BiSe by atomic layer deposition (ALD) using Bi(NMe2)3 and Se(SnMe3)2 as volatile and reactive Bi and Se precursors, respectively. The growth rate varies from 1.5 to 2.0 angstrom/cycle in the deposition temperature range of 90-120 degrees C. Higher deposition temperatures lead to increased grain sizes and enhanced crystallinity of resulting films. Further microstructure characterization reveals the formation of crystalline domains with varying orientations and nanotwinned boundaries. The presence of Bi-Bi zigzag bilayers and the formation of the BiSe phase were confirmed by the existence of the Bi-Bi binding energy peak in the XPS spectra and Raman spectra. Furthermore, the electrical conductivity of BiSe ranged from 1420 to 1520 S/cm due to the ultrahigh carrier concentration (2-3.5 x 1021 cm-3), which is the highest among undoped bismuth selenide-based materials.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10401 - Organic chemistry
Result continuities
Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace
Others
Publication year
2023
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Journal of the European Ceramic Society
ISSN
0955-2219
e-ISSN
1873-619X
Volume of the periodical
43
Issue of the periodical within the volume
11
Country of publishing house
GB - UNITED KINGDOM
Number of pages
6
Pages from-to
4808-4813
UT code for WoS article
001004620000001
EID of the result in the Scopus database
2-s2.0-85152640841