Automatic test-bench for SiC power devices using LabVIEW

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216275%3A25510%2F24%3A39922705" target="_blank" >RIV/00216275:25510/24:39922705 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26220/24:PU151233

Result on the web

<a href="https://sciendo.com/article/10.2478/jee-2024-0011" target="_blank" >https://sciendo.com/article/10.2478/jee-2024-0011</a>

DOI - Digital Object Identifier

<a href="http://dx.doi.org/10.2478/jee-2024-0011" target="_blank" >10.2478/jee-2024-0011</a>

Result language

angličtina

Original language name

Automatic test-bench for SiC power devices using LabVIEW

Original language description

This paper is devoted to the improvement existing models of electronics devices, which are used in powers electronics as switching devices, and investigate a LabVIEW-based automatic test-bench for Silicon carbide (SiC) power devices. In recent years, power electronic devices are required to be capable handle with higher voltage, leads to development of new generation of power electronic devices, such as SiC devices. However, using a simulation platform, such as Spice, to diminish the complexity of power electronic design with these new devices is hindered by the lack of precise models. The proposed test-bench enables not only measuring static characteristics of SiC power devices, but also extracting key parameters required by simulations. These extracted parameters are then employed in the existing device model, and the simulation results which are based on the model with original parameters and models with extracted parameters are compared with measured results. The comparison clearly demonstrates that parameters obtained from the proposed test-bench significantly enhance the Spice model.

Czech name

—

Czech description

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Type

J_imp - Article in a specialist periodical, which is included in the Web of Science database

CEP classification

—

OECD FORD branch

20201 - Electrical and electronic engineering

Project

—

Continuities

I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year

2024

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Journal of Electrical Engineering

ISSN

1335-3632

e-ISSN

1339-309X

Volume of the periodical

75

Issue of the periodical within the volume

2

Country of publishing house

SK - SLOVAKIA

Number of pages

9

Pages from-to

77-85

UT code for WoS article

001197533000003

EID of the result in the Scopus database

2-s2.0-85190495758