Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F00%3A22200039" target="_blank" >RIV/00216305:26110/00:22200039 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Temperature dependence of 1/f noise and transport characteristics as non-destructive testing of monocrystalline silicon solar cells
Original language description
Dependence of the noise spectral voltage density Sv(f) in the frequency range 1 Hz to 10 Hz and transport characteristic for a monocrystalline silicon solar cells have been investigated. The magnitude of the noise spectra for the Si solar cell shows a decrease of noise magnitude with increasing temperature between 300K to 400 K. Also for I-V curves, both recombination-generation and diffusion current components are increases with temperature.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2000
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
15th World Conference of Non-Destructive Testing
ISBN
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ISSN
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e-ISSN
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Number of pages
5
Pages from-to
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Publisher name
Italian Society for Non-Destructvie Testing Monitoring Diagnostics
Place of publication
Roma
Event location
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Event date
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Type of event by nationality
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UT code for WoS article
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