Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F12%3APU99898" target="_blank" >RIV/00216305:26220/12:PU99898 - isvavai.cz</a>
Result on the web
<a href="http://www.hindawi.com/journals/ijp/2012/324853/" target="_blank" >http://www.hindawi.com/journals/ijp/2012/324853/</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Low-Frequency Noise and Microplasma Analysis for c-Si Solar Cell Characterization
Original language description
This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasma presence to evaluate the solar cell technology. Three sets of monocrystalline silicon solar cells (c-Si) varying in front side phosphorus doped emitters were produced by standard screen-printing technique. From the measurements it follows that the noise spectral density related to defects is of 1/f type and its magnitude. It has been established that samples showing low noise feature high-conversion efficiency. The best results were reached for a group solar cells with selective emitter structure prepared by double-phosphorus diffusion process.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/GA102%2F09%2F0859" target="_blank" >GA102/09/0859: Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.</a><br>
Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
INTERNATIONAL JOURNAL OF PHOTOENERGY
ISSN
1110-662X
e-ISSN
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Volume of the periodical
2012
Issue of the periodical within the volume
2012
Country of publishing house
EG - EGYPT
Number of pages
5
Pages from-to
1-5
UT code for WoS article
000301242900001
EID of the result in the Scopus database
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