Microplasma analysis and noise spectroscopy of c-Si solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95711" target="_blank" >RIV/00216305:26220/11:PU95711 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Microplasma analysis and noise spectroscopy of c-Si solar cells
Original language description
Three sets of c-Si solar cells varying in front side phosphorus doped emitters were produced by standard screen printing technique. This paper brings the comparison of solar cell conversion efficiency and results from a noise spectroscopy and microplasmapresence. As it was already shown in previous publications [1-3] noise spectral density reflects the quality of solar cells and thus it represents an alternative advanced cell diagnostic tool. Our results confirm this relationship and moreover bring theclear evidence for the maximum spectral noise voltage density being related with the emitter structure. The best results were reached for a group of solar cell with selective emitter structure prepared by double phosphorus diffusion process.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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