Noise and scanning by local illumination as reliability estimation for silicon solar cells

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F01%3APU24205" target="_blank" >RIV/00216305:26110/01:PU24205 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26110/01:PU34160

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Noise and scanning by local illumination as reliability estimation for silicon solar cells

Original language description

This paper presents two methods, namely those using noise and homogeneity measurements of a large area solar cells, for determining the local defects, which bring down efficiency and long reliability of single-crystal silicon solar cells.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

<a href="/en/project/GA102%2F99%2F0953" target="_blank" >GA102/99/0953: Noise and galvanomagnetic spectroscopy of single crystalline materials of type II - VI</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2001

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Fluctuation and Noise Letters

ISSN

0219-4775

e-ISSN

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Volume of the periodical

1

Issue of the periodical within the volume

1

Country of publishing house

SG - SINGAPORE

Number of pages

6

Pages from-to

"L21"

UT code for WoS article

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EID of the result in the Scopus database

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