Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26110%2F22%3APU145230" target="_blank" >RIV/00216305:26110/22:PU145230 - isvavai.cz</a>
Result on the web
<a href="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf" target="_blank" >https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf</a>
DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
Original language description
The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
21001 - Nano-materials (production and properties)
Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů