Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F22%3APU145230" target="_blank" >RIV/00216305:26220/22:PU145230 - isvavai.cz</a>
Result on the web
<a href="https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf" target="_blank" >https://www.eeict.cz/eeict_download/archiv/sborniky/EEICT_2022_sbornik_1_v2.pdf</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Lithographic thin–film structures based on Electrochromic materials: Case study by scanning probe microscopy
Original language description
The main object of this study will be based on producing and characterization of lithographic thin–film structures produced based electrochromic materials. Atomic force microscopy will be used as a main method of evaluation the morphology of lithographic structures. The optical properties of eslectrochromic materials will be analyze using scanning near–field optical microscopy by applying different electrical potential.
Czech name
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Czech description
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Publication year
2022
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings I of the 28th Conference STUDENT EEICT 2022 General Papers
ISBN
978-80-214-6029-4
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
409-414
Publisher name
Brno University of Technology, Faculty of Electrical Engineering and Communication
Place of publication
Brno
Event location
Brno
Event date
Apr 26, 2022
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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