Ion Scattering Spectrosopy - A Tool for Surface Analysis.
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU22609" target="_blank" >RIV/00216305:26210/01:PU22609 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Ion Scattering Spectrosopy - A Tool for Surface Analysis.
Original language description
Ion Scattering Spectroscopy (ISS) is one of the analytical techniques which are developed and used at the institute surface science group for chemical composition analysis of solid state surfaces and thin films. The chemical composition is calculated from the time of flight spectrum of noble gases ions scattered on the examined surfaces. Their energy after scattering is measured by two meters long drift tube ended by a particle detector. Two typical experimental results measured on Cu/SiO2 and Ga/SiO2 ssamples are discussed.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
—
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Juniormat '01 sborník
ISBN
—
ISSN
—
e-ISSN
—
Number of pages
5
Pages from-to
86-90
Publisher name
Fakulta strojního inženýrství VUT v Brně
Place of publication
Brno
Event location
Brno,VUT-FSI
Event date
Sep 19, 2001
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
—