Application of ToF - LEIS for Analysis of Surfaces and Ultra Thin Films

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU23125" target="_blank" >RIV/00216305:26210/01:PU23125 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Application of ToF - LEIS for Analysis of Surfaces and Ultra Thin Films
Original language description
Low Energy Ion Scattering (LEIS) belongs to a wide group of surface science analytical techniques. Low detection limit and extreme surface sensitivity are the main advantages of LEIS. Atomic composition of analysed surfaces is determined from the energydistribution of the scattered rare gas ions. Their kinetic energy can be measured by a Time-of-Flight (ToF) spectrometer. Capabilities of the ToF LEIS spectrometer will be demonstrated at analysis of gallium layers evaporated on a SiO2 substrate
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Sborník příspěvků konference Nové trendy ve fyzice
ISBN
80-214-1992-X
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
404-409
Publisher name
FEI VUT v Brně
Place of publication
Brno
Event location
Brno, FEI VUT
Event date
Nov 15, 2001
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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