Noncontact Scanning Force Microscopy - Principles and Simulations

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU23115" target="_blank" >RIV/00216305:26210/01:PU23115 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Noncontact Scanning Force Microscopy - Principles and Simulations
Original language description
In the contribution, some fundamental phenomena in noncontact Scanning Force Microscopy (SFM) are studied. In this technique, the surface profile is measured by changes of resonance frequency of the vibrating cantilever. In the first part, the basic principles of noncontact SFM are described. Simulations of a tip moving and oscillating over a silicon atomic structure will be discussed in the second part.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Sborník příspěvků konference Nové trendy ve fyzice
ISBN
80-214-1992-X
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
369-374
Publisher name
FEI VUT v Brně
Place of publication
Brno
Event location
Brno, FEI VUT
Event date
Nov 15, 2001
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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