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Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU22543" target="_blank" >RIV/00216305:26210/01:PU22543 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits

  • Original language description

    As generally known, in the noncontact mode the changes of effective resonance frequency of a cantilever with the tip-surface distance are used for imaging solid surfaces. For a long time, van der Waals attractive forces between atoms of the tip and surface atoms [1] had been considered to have a decisive influence for making a contrast in images taken by the noncontact mode of SFM. However, very recently the true atomic resolution on several surfaces by means of the noncontact UHV SFM have been obtaineed (e.g. Si, GaAs, InP, NaCl). This gives rise to questions if the long-range van der Waals forces themselves are capable to provide such an atomic resolution or if some additional short-range forces due to an onset of covalent bonds between atoms of thetip and surface atoms should not be taken into account as well. In [2] the true atomic resolution of the noncontact SFM is explained only by means of the long-range van der Waals forces and by nonlinear oscillations of the cantilever. How

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    BM - Solid-state physics and magnetism

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2001

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts

  • ISBN

  • ISSN

  • e-ISSN

  • Number of pages

    1

  • Pages from-to

    285-285

  • Publisher name

    P. Marcus, A. Galtayries, N. Frémy

  • Place of publication

    Avignon, France

  • Event location

    Avignon

  • Event date

    Sep 30, 2001

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article