Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F01%3APU22543" target="_blank" >RIV/00216305:26210/01:PU22543 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noncontact Scanning Force Microscopy ? a Computer Simulation of Resolution Limits
Original language description
As generally known, in the noncontact mode the changes of effective resonance frequency of a cantilever with the tip-surface distance are used for imaging solid surfaces. For a long time, van der Waals attractive forces between atoms of the tip and surface atoms [1] had been considered to have a decisive influence for making a contrast in images taken by the noncontact mode of SFM. However, very recently the true atomic resolution on several surfaces by means of the noncontact UHV SFM have been obtaineed (e.g. Si, GaAs, InP, NaCl). This gives rise to questions if the long-range van der Waals forces themselves are capable to provide such an atomic resolution or if some additional short-range forces due to an onset of covalent bonds between atoms of thetip and surface atoms should not be taken into account as well. In [2] the true atomic resolution of the noncontact SFM is explained only by means of the long-range van der Waals forces and by nonlinear oscillations of the cantilever. How
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
9th European Conference on Applications of Surface and Interface Analysis (ECASIA'01) Book of Abstracts
ISBN
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ISSN
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e-ISSN
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Number of pages
1
Pages from-to
285-285
Publisher name
P. Marcus, A. Galtayries, N. Frémy
Place of publication
Avignon, France
Event location
Avignon
Event date
Sep 30, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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