Vibrational Analysis of the Cantilever in Non-contact Scanning Force Microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F00%3A00000030" target="_blank" >RIV/00216305:26210/00:00000030 - isvavai.cz</a>

Alternative codes found

RIV/00216305:26210/00:PU25059

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Vibrational Analysis of the Cantilever in Non-contact Scanning Force Microscopy

Original language description

In this paper the basic principles of non-contact scanning force microscopy (SFM) are explained. The major long-range forces between a tip and a sample, and consequently the changes of vibration characteristics with the tip-sample distance, are discussed. To estimate the resolution limits of the non-contact method, the motion of a vibrating silicon cantilever above testing silicon nanostructure models was simulated numerically. This was done both in mode of constant height and constant force. To simulate the real behaviour of the tip in the mode of constant force, we included into our calculations the feedback loop.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

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Project

Result was created during the realization of more than one project. More information in the Projects tab.

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2000

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Surface and Interface Analysis

ISSN

0142-2421

e-ISSN

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Volume of the periodical

2000

Issue of the periodical within the volume

30

Country of publishing house

US - UNITED STATES

Number of pages

5

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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