Vibrational analysis of the cantilever in non-contact scanning force microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F99%3A00000126" target="_blank" >RIV/00216305:26210/99:00000126 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Vibrational analysis of the cantilever in non-contact scanning force microscopy
Original language description
SFM is based on detection of forces between an observed sample surface and a sharp tip located on the end of cantilever. In non-contact mode the changes of effective resonant fraquency of the cantilever with a distance between the tip and surface is utilised for imaging the nanostructure objects. The forces having decisive influence in the non-contact mode of UHV SFM van der Waals attractive forces between the tip and surface atoms. We simulated resolution limits of the non-contact method based on theseforces - to describe the interaction between the tip and testing surface structures we considered the tip of conical shape terminated by a spherical cap. The surface was modelled by an infinite surface plane bearing atomic scale objects (nanostructures).
Czech name
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Czech description
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Project
<a href="/en/project/GV101%2F97%2FK009" target="_blank" >GV101/97/K009: Scientific center of nanotechnologies and surface engineering</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
1999
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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