Instrument for thin film diagnostics by UV spectroscopic reflectometry
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F04%3APU47899" target="_blank" >RIV/00216305:26210/04:PU47899 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Instrument for thin film diagnostics by UV spectroscopic reflectometry
Original language description
Instrument for thin film diagnostics by UV spectroscopic reflectometry
Czech name
Zařízení pro diagnostiku tenkých vrstev pomocí UV spektroskopické reflektometrie
Czech description
Zařízení pro diagnostiku tenkých vrstev pomocí UV spektroskopické reflektometrie
Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2004
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Surface and Interface Analysis
ISSN
0142-2421
e-ISSN
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Volume of the periodical
36
Issue of the periodical within the volume
8
Country of publishing house
US - UNITED STATES
Number of pages
4
Pages from-to
1102-1105
UT code for WoS article
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EID of the result in the Scopus database
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