A new program for the design of electron microscopes

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F08%3APU78326" target="_blank" >RIV/00216305:26210/08:PU78326 - isvavai.cz</a>

Alternative codes found

RIV/68081731:_____/08:00315558

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

A new program for the design of electron microscopes

Original language description

The paper describes the basic features of a new program EOD (Electron Optical Design), primarily intended for the design of systems of electron lenses and deflectors for scanning and transmission electron microscopes. A very accurate first-order finiteelement method in graded topologically regular meshes provides the fields. Electron optical properties can be analyzed from standard paraxial trajectories and aberration integrals for combined lens and deflection systems or, for a general system, from theresults of very accurate ray-tracing. The advantage of EOD is that it includes a user-friendly interface, simplifying the output of results and the whole design procedure. EOD is used by undergraduate and postgraduate students at ISI and TU Brno.

Czech name

Nový program pro návrh elektronových mikroskopů

Czech description

Nový program pro návrh elektronových mikroskopů

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

BM - Solid-state physics and magnetism

OECD FORD branch

—

Project

—

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2008

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Physics Procedia

ISSN

1875-3892

e-ISSN

—

Volume of the periodical

1

Issue of the periodical within the volume

1

Country of publishing house

NL - THE KINGDOM OF THE NETHERLANDS

Number of pages

10

Pages from-to

—

UT code for WoS article

—

EID of the result in the Scopus database

—