Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F17%3APU123567" target="_blank" >RIV/00216305:26210/17:PU123567 - isvavai.cz</a>
Result on the web
<a href="https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005" target="_blank" >https://www.osapublishing.org/oe/fulltext.cfm?uri=oe-25-14-16560&id=369005</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1364/OE.25.016560" target="_blank" >10.1364/OE.25.016560</a>
Alternative languages
Result language
angličtina
Original language name
Imaging of near-field interference patterns by a-SNOM – influence of illumination wavelength and polarization state
Original language description
Scanning near-field optical microscopy (SNOM) in combination with interference structures is a powerful tool for imaging and analysis of surface plasmon polaritons (SPPs). However, the correct interpretation of SNOM images requires profound understanding of principles behind their formation. To study fundamental principles of SNOM imaging in detail, we performed spectroscopic measurements by an aperture-type SNOM setup equipped with a supercontinuum laser and a polarizer, which gave us all the degrees of freedom necessary for our investigation. The series of wavelength- and polarization-resolved measurements, together with results of numerical simulations, then allowed us to identify the role of individual near-field components in formation of SNOM images, and to show that the out-of-plane component generally dominates within a broad range of parameters explored in our study. Our results challenge the widespread notion that this component does not couple to the a-SNOM probe and indicate that the issue of SNOM probe sensitivity towards the in-plane and out-of-plane near-field components – one of the most challenging tasks of near field interference SNOM measurements – is not yet fully resolved.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
10302 - Condensed matter physics (including formerly solid state physics, supercond.)
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
OPTICS EXPRESS
ISSN
1094-4087
e-ISSN
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Volume of the periodical
25
Issue of the periodical within the volume
14
Country of publishing house
US - UNITED STATES
Number of pages
13
Pages from-to
16560-16573
UT code for WoS article
000407815100085
EID of the result in the Scopus database
2-s2.0-85022075647