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2D calculation of parasitic fields in misaligned multipole electron-optical systems

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F23%3APU149071" target="_blank" >RIV/00216305:26210/23:PU149071 - isvavai.cz</a>

  • Result on the web

    <a href="https://doi.org/10.1016/j.ultramic.2023.113825" target="_blank" >https://doi.org/10.1016/j.ultramic.2023.113825</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.1016/j.ultramic.2023.113825" target="_blank" >10.1016/j.ultramic.2023.113825</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    2D calculation of parasitic fields in misaligned multipole electron-optical systems

  • Original language description

    The effects of geometrical imperfections in electron-optical components are usually evaluated in 3D simulations. These calculations inherently take a long time, require a large amount of memory, and do not directly produce the necessary axial field functions. We present a 2D perturbation method to calculate parasitic fields in misaligned multipole systems. Our method is based on finding an equivalent potential perturbation, similarly to Sturrock's method, but does not rely on the potential being differentiable. The method is directly applicable to both electrostatic and non-saturated magnetic problems. It does not require any 3D data and it is fully compatible with existing finite element method codes such as EOD. The proposed method produces axial field functions with an accuracy of units to a few tens of percents, depending on the number of unperturbed multipole field components used and the geometry. The results can then be used, for instance, to determine the parasitic imaging aberrations of the misaligned optical system using standard methods, in order to evaluate the effect of mechanical design tolerances.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database

  • CEP classification

  • OECD FORD branch

    21100 - Other engineering and technologies

Result continuities

  • Project

  • Continuities

Others

  • Publication year

    2023

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Ultramicroscopy

  • ISSN

    0304-3991

  • e-ISSN

    1879-2723

  • Volume of the periodical

    253

  • Issue of the periodical within the volume

    November 2023

  • Country of publishing house

    NL - THE KINGDOM OF THE NETHERLANDS

  • Number of pages

    8

  • Pages from-to

    1-8

  • UT code for WoS article

    001061696400001

  • EID of the result in the Scopus database

    2-s2.0-85167581509