Spot intensity processing in LEED images

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26210%2F99%3A00000198" target="_blank" >RIV/00216305:26210/99:00000198 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Spot intensity processing in LEED images

Original language description

Images of diffraction patterns observed in low energy electron diffraction (LEED) are usually taken by CCD camera. Common approach in their processing is based on steps as follows: radiometric corrections, reduction of noise, finding the diffraction spots, assignment of particular spot position, subtraction of background, spot intensity evaluation and corrections to the experimental conditions. The contribution is focused upon removing undersirable background in diffraction images.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JR - Other machinery industry

OECD FORD branch

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Project

<a href="/en/project/GV101%2F97%2FK009" target="_blank" >GV101/97/K009: Scientific center of nanotechnologies and surface engineering</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

1999

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

ECASIA 99

ISBN

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ISSN

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e-ISSN

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Number of pages

1

Pages from-to

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Publisher name

ECASIA 99

Place of publication

Sevilla, Španělsko

Event location

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Event date

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Type of event by nationality

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UT code for WoS article

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