Stress Testing in the Evaluation the Reliability of Electronic Devices
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F01%3APU24378" target="_blank" >RIV/00216305:26220/01:PU24378 - isvavai.cz</a>
Result on the web
—
DOI - Digital Object Identifier
—
Alternative languages
Result language
angličtina
Original language name
Stress Testing in the Evaluation the Reliability of Electronic Devices
Original language description
Reliability is basically a quality parameter which must be incorporated into the product. The reliability attributes must be established already at the design phase. With increasing device complexity, reliability becomes an elusive, but significant parameter to define and achieve. It also becomes more difficult to control, demonstrate, and ensure as an operational characteristic under the projected conditions of use by the customer. This article summarizes the conceptions of the evaluation of the reliabbility of electronic devices.
Czech name
—
Czech description
—
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
—
Result continuities
Project
<a href="/en/project/GA102%2F00%2F0938" target="_blank" >GA102/00/0938: Pressure analyser</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2001
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Socrates Workshop 2001. Intensive Training Programme in Electronic System Design. Proceedings
ISBN
80-214-2027-8
ISSN
—
e-ISSN
—
Number of pages
5
Pages from-to
253-257
Publisher name
Ing. Zdeněk Novotný, CSc., Brno, Ondráčkova 105
Place of publication
Crete 2001
Event location
Chania, Crete, Greece
Event date
Sep 3, 2001
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
—