A/D Switched-Current Converter with Built-In Self Testing Features
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F02%3APU29976" target="_blank" >RIV/00216305:26220/02:PU29976 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
A/D Switched-Current Converter with Built-In Self Testing Features
Original language description
Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-currentstructure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current techniquue, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
JB - Sensors, detecting elements, measurement and regulation
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2002
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics SCI 2002
ISBN
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ISSN
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e-ISSN
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Number of pages
4
Pages from-to
250-253
Publisher name
SCI
Place of publication
Orlando
Event location
Orlando
Event date
Jun 14, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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