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A/D Switched-Current Converter with Built-in Self Testing Features

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU42503" target="_blank" >RIV/00216305:26220/03:PU42503 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    A/D Switched-Current Converter with Built-in Self Testing Features

  • Original language description

    Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-currentstructure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current techniquue, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JC - Computer hardware and software

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F02%2F1032" target="_blank" >GA102/02/1032: Embedded control systems and their inter-communication</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2003

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III

  • ISBN

    980-07-8150-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    367-370

  • Publisher name

    The International Institute of Informatics and Systemics

  • Place of publication

    Orlando

  • Event location

    Orlando - Florida

  • Event date

    Jul 14, 2002

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article