A/D Switched-Current Converter with Built-in Self Testing Features

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F03%3APU42503" target="_blank" >RIV/00216305:26220/03:PU42503 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
A/D Switched-Current Converter with Built-in Self Testing Features
Original language description
Presented paper deals with the practical aspects of implementation of test circuitry into CMOS design of an analogue-to-digital converter. Properties of the structure of switched-current mode are discussed for design-for-test. Since the switched-currentstructure changes the mode of operation of current copiers (switched-current memory cell), large fault coverage can be reached if creating proper design-for-test. As the example, analysis of an A/D converter is used, designed in switched-current techniquue, when sampling data. The contribution aims at problems concerned with controllability and observability of internal nodes. The models developed were utilized and SPICE simulations performed to verify theoretical proposals.
Czech name
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Czech description
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Project
<a href="/en/project/GA102%2F02%2F1032" target="_blank" >GA102/02/1032: Embedded control systems and their inter-communication</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2003
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 6th World Multiconference on Systemics, Cybernetics and Informatics, 2002, Vol. III
ISBN
980-07-8150-1
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
367-370
Publisher name
The International Institute of Informatics and Systemics
Place of publication
Orlando
Event location
Orlando - Florida
Event date
Jul 14, 2002
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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