Very low energy scanning transmission electron microscopy

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU44007" target="_blank" >RIV/00216305:26220/04:PU44007 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Very low energy scanning transmission electron microscopy

Original language description

Combined SLEEM/scanning low energy transmission electron microscope (SLETEM) uses a cathode lens to decelerate the electron beam just in front of the specimen surface, and is able to reach a resolution of a few nm even at a landing energy of a few eV. This provides the flexibility to investigate the transmission of electrons through thin samples at electron energies as low as 1 eV.

Czech name

Very low energy scanning transmission electron microscopy

Czech description

viz anotace v angličtině

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2004

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of EMC 2004

ISBN

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ISSN

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e-ISSN

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Number of pages

2

Pages from-to

"P02"

Publisher name

EMC 2004

Place of publication

Antwerpy, Belgie

Event location

Antwerps, Belgium

Event date

Aug 22, 2004

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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