Scanning low-and very low energy electron microscopy

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F15%3A00450822" target="_blank" >RIV/68081731:_____/15:00450822 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Scanning low-and very low energy electron microscopy
Original language description
Scanning low energy electron microscopy (SLEEM) allows imaging samples with a good lateral resolution using electrons of an arbitrarily low energy. This is achieved by means of the Cathode Lens, which is essentially a decelerating electrostatic field inserted just before the electron beam hits the sample. The technique allows both for a reflection and a transmission mode and energies down to zero electron volts. The region of very low electron energies (below 50 eV) offers some interesting phenomena that are not encountered at the usual energies of a few units to tens of keV that are employed in ordinary scanning electron microscopes. To name but a few: Reflectivity of very slow electrons in the very low energy range can be correlated with the electronic structure of the material which in turn is related to the crystallographic orientation of the sample. This fact has been successfully used for the extraction of crystallographic orientation related information in polycrystalline metals
Czech name
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Czech description
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Project
<a href="/en/project/TE01020118" target="_blank" >TE01020118: Electron microscopy</a><br>
Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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