Imaging the local density of electronic states by very low energy electron reflectivity

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F68081731%3A_____%2F12%3A00386397" target="_blank" >RIV/68081731:_____/12:00386397 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Imaging the local density of electronic states by very low energy electron reflectivity
Original language description
This work was concerned with the relationship between the reflectivity of very low energy electrons from a crystalline sample and its density of electron states above the vacuum level. Also, as different crystallographic orientations of the same single crystal exhibit different density of states, the usefulness of electron reflectivity at very low energies was demonstrated for the determination of crystallographic orientation. The technique chosen was the Scanning Low Energy Electron Microscopy (SLEEM)wich allows using arbitrarily low electron energies while preserving a very good image resolution. In our experiments, the incident electron energy ranged between 0 and 45 eV.
Czech name
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Czech description
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Project
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Continuities
I - Institucionalni podpora na dlouhodoby koncepcni rozvoj vyzkumne organizace

Publication year
2012
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 13th International Seminar on Recent Trends in Charged Particle Optics and Surface Physics Instrumentation
ISBN
978-80-87441-07-7
ISSN
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e-ISSN
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Number of pages
2
Pages from-to
57-58
Publisher name
Institute of Scientific Instruments AS CR, v.v.i
Place of publication
Brno
Event location
Skalský dvůr
Event date
Jun 25, 2012
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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