All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Model of the cantilever used in Atomic Force Microscopy

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F04%3APU44747" target="_blank" >RIV/00216305:26220/04:PU44747 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Model of the cantilever used in Atomic Force Microscopy

  • Original language description

    New types of weak forces measurements with Atomic Force Microscope (AFM) are very challenging for experimental physics and call for new studies on control strategies operating the AFM. It is thus necessary to first develop a precise model of the cantilever with its sharp tip, in interaction with the scanned sample. This paper presents a model of the cantilever, that is based on beam theory and taking into account the influence of the long distance interaction forces. Developed multi mode cantilever mmodel is capable to describe the behaviour of the real measuring system with good precision. Model is taking into a consideration the influence of higher harmonics and their share on the total tip displacement of the cantilever. Simulated frequency spectrais fully fitting to theoretical expectation and has been successfully confronted with measured data on the real system with a cantilever of same dimensions and properties. For a better understanding of the interaction and its impact on ca

  • Czech name

    Model nosníku v mikroskopii atomových sil

  • Czech description

    Výzvou experimentální fyziků dnešní doby jsou nové měřicí metody v AFM. Nutnou podmínkou je přesný model krakorce a jeho interakce s měřeným vzorkem. Článek presentuje model krakorce, který je založen na teorii svazku a zohledňuje vliv sil na velké vzdálenosti.

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GD102%2F03%2FH116" target="_blank" >GD102/03/H116: TALENT - coordinated education of Ph. D. students in control engineering and robotics</a><br>

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Others

  • Publication year

    2004

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Journées Nanosciences Nanotechnologies en Rhône-Alpes 2004

  • ISBN

  • ISSN

  • e-ISSN

  • Number of pages

    1

  • Pages from-to

    82-82

  • Publisher name

    CNRS, CEA

  • Place of publication

    Grenoble

  • Event location

    Grenoble

  • Event date

    Nov 18, 2004

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article