SPM methods for nanotechnology
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU50770" target="_blank" >RIV/00216305:26220/05:PU50770 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
SPM methods for nanotechnology
Original language description
The paper describes two methods from SPM (Scanning Probe Microscopy) family and their junction. First part is dealing with common description of STM (Scanning Tunneling Microscopy) method and its advantages and disadvantages. Two modes of TS 3130 modified STM are described. The 3D processing and its benefit for defectoscopy and SPM methods are studied. The details about SNOM (Scanning Near-field Optical Microscopy) method, its advantages and disadvantages in the local nondestructive measurement are alsso presented
Czech name
SPM metody v nanotechnologii
Czech description
Článek popisuje dvě metody z SPM. Uvádí princip metod STM a SNOM. V článku je zobrazena 3D transformace získaných snímků.
Classification
Type
D - Article in proceedings
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2005
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
5th INTERNATIONAL CONFERENCE OF PHD STUDENTS
ISBN
ISBN 9636616735
ISSN
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e-ISSN
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Number of pages
6
Pages from-to
79-84
Publisher name
University of Miskolc, Hungary
Place of publication
NEUVEDEN
Event location
Miskolc
Event date
Aug 14, 2005
Type of event by nationality
EUR - Evropská akce
UT code for WoS article
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