Gamma Ray Damage of Unbiased CCD Image Sensors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F05%3APU57318" target="_blank" >RIV/00216305:26220/05:PU57318 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Gamma Ray Damage of Unbiased CCD Image Sensors

Original language description

High image quality Charge-coupled device (CCD) image sensors are needed in many applications. Low noise and high dynamic range are critical parameters required in scientific and industrial applications. In many of the applications, however, the CCD imagesensor can be irradiated by a ionizing radiation, as alpha, beta, gamma or x-ray. This paper shows behaviour of low noise, high dynamic range, 1 Megapixel Frame-Transfer CCD FTT1010-M [1] image sensor radiated by gamma ray radiation. CCD image sensor driver board with rad-hard components was designed and used during the tests. Results of the investigation will be used in system for protein crystallization study in microgravity.

Czech name

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Czech description

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Type

O - Miscellaneous

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2005

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů