Noise spectroscopy of new silicon solar cells with double-sided texture

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU68432" target="_blank" >RIV/00216305:26220/07:PU68432 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Noise spectroscopy of new silicon solar cells with double-sided texture

Original language description

This work deals with the usage of micro-plasmas signal noise for solar cells diagnostic. When high elekctric field is applied to PN junction with some tehnological imperfections it produces in tiny areas od enhanced impact ionization called micro-plasmaswhich could lead do deterioration in quality or desturition of PN junction. On this account it si possible to use methods which indicate presence of micro-plasma in juncition and enable qualit a quantitaive description of tested cells.

Czech name

Šumová spektroskopie nových článků s texturou na obou stranách

Czech description

viz abstrakt. v originále

Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GP102%2F05%2FP199" target="_blank" >GP102/05/P199: New methods of non-destructive testing of contacts quality of photovoltaic cells</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year

2007

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

Proceedings of SPIE

ISSN

0277-786X

e-ISSN

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Volume of the periodical

2007

Issue of the periodical within the volume

6600

Country of publishing house

US - UNITED STATES

Number of pages

8

Pages from-to

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UT code for WoS article

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EID of the result in the Scopus database

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