Micro-plasma Luminescence And Signal Noise Used To Solar Cells Defect Diagnostic

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU84106" target="_blank" >RIV/00216305:26220/09:PU84106 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Micro-plasma Luminescence And Signal Noise Used To Solar Cells Defect Diagnostic

Original language description

This work deals with the usage of signal noise and micro-plasmas luminescence for solar cells diagnostic. When high electric field is applied to PN junction of solar cell with some technological imperfections it produces in tiny areas of enhanced impactionization called micro-plasmas which could lead to deterioration in quality or destruction of PN junction.

Czech name

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Czech description

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Type

J_x - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F09%2F0859" target="_blank" >GA102/09/0859: Local Light Emission in Association with Stochastic Processes in PN Junction in Solar Cells at Cryo Temperature.</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Name of the periodical

AIP conference proceedings

ISSN

0094-243X

e-ISSN

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Volume of the periodical

2009

Issue of the periodical within the volume

1129

Country of publishing house

US - UNITED STATES

Number of pages

4

Pages from-to

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UT code for WoS article

000267057200147

EID of the result in the Scopus database

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