Noise diagnostics of local defects in solar cells

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F07%3APU70341" target="_blank" >RIV/00216305:26220/07:PU70341 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Noise diagnostics of local defects in solar cells

Original language description

This study deals with the use of noise for solar cells diagnostic purposes. When a high electric field is applied to a PN junction containing some technological imperfections, local breakdowns arises in micro-sized regions, which in turn can lead to thedeterioration in quality or destruction of the PN junction. It is therefore advisable to use methods which can indicate the presence of these regions in the junction and make the quality assessment and quantitative description of the tested cells possible.

Czech name

Šumová diagnostika lokálních defektů solárních článků

Czech description

Tento článek se zabývá využitím šumu mikroplazmy pro diagnostiku solárních článků.

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

<a href="/en/project/GA102%2F06%2F1551" target="_blank" >GA102/06/1551: Diagnostics of PN junction electronic devices by means of microplasma noise evaluation</a><br>

Continuities

P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2007

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proc. of EDS IMAPS CS 2007

ISBN

978-80-214-3470-7

ISSN

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e-ISSN

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Number of pages

5

Pages from-to

409-413

Publisher name

IMAPS CS

Place of publication

Brno

Event location

BRNO

Event date

Sep 20, 2007

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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