Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81089" target="_blank" >RIV/00216305:26220/09:PU81089 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Dielectric relaxation spectroscopy as a tool for investigation of dielectric thin films and fabrication method thereof for microcapacitor integration

Original language description

Dielectric relaxation spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges to the application of external electric field. In the present research, we would like to apply the DRS for the study of physical and electrical properties of dielectric thin films. The important properties of dielectric materials, as dielectric contant and dielectric lossoften vary as temperature or frequence varies. Thus the operation range for applications varies accordingly.

Czech name

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Czech description

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Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Proceedings of IEEE Workshop Králíky 2009

ISBN

978-80-214-3938-2

ISSN

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e-ISSN

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Number of pages

4

Pages from-to

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Publisher name

Novapres

Place of publication

Brno

Event location

Králíky

Event date

Aug 31, 2009

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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