Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU82502" target="_blank" >RIV/00216305:26220/09:PU82502 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Dielectric Relaxation Spectroscopy as a Tool for The Investigation of Thin Oxide Layers
Original language description
Dielectric Relaxation Spectroscopy (DRS) is a powerful tool for the investigation of materials. DRS is based on the measurement and evaluation of the response of electric dipoles, either induced or permanent, and weakly bound electric charges, to the application of external electric field. The main information that can be extracted from the DRS is related to the molecular dynamics of dipole or loosely attached charge carriers. Therefore, DRS finds application in those fields where mobility of individualmolecules, segments of molecules or separate chemical bonds or changes in chemical composition is involved - monitoring of hardening or swelling processes, analysis of glass transition, applications in degradation and ageing of materials based on disappearance or emergence of dipoles and charge-carriers. In the present research, we would like to apply the DRS for the study of thin oxide layers on noble metals. Current experimental equipment available in the Department of Physics, allowi
Czech name
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Czech description
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Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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