ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81551" target="_blank" >RIV/00216305:26220/09:PU81551 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS
Original language description
We have tested the sample of MOSFET by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy is non-destructive testing method. This method is based on interaction of two signals. Electrical signal of frequency fE and ultrasonic signal of frequency fU. The ultrasonic signal induces the resistance change in the sample structure. Defects and un-homogeneities are the sources of new signal on frequency which is given by superposition or subtraction of exciting frequencies fE and fU. We suppose that the ultrasonic wave have some influence on the particle mobility. We have tested the sample of MOSFET IRF 510. We have analyzed signal on frequency of ultrasonic excitation fU for different amplitudes on DC drain voltage and gate voltage. In this paper you can see some results which consequent from our measurements
Czech name
ELECTRO-ULTRASONIC SPECTROSCOPY OF MOSFETS
Czech description
We have tested the sample of MOSFET by electro-ultrasonic spectroscopy. Electro-ultrasonic spectroscopy is non-destructive testing method. This method is based on interaction of two signals. Electrical signal of frequency fE and ultrasonic signal of frequency fU. The ultrasonic signal induces the resistance change in the sample structure. Defects and un-homogeneities are the sources of new signal on frequency which is given by superposition or subtraction of exciting frequencies fE and fU. We suppose that the ultrasonic wave have some influence on the particle mobility. We have tested the sample of MOSFET IRF 510. We have analyzed signal on frequency of ultrasonic excitation fU for different amplitudes on DC drain voltage and gate voltage. In this paper you can see some results which consequent from our measurements
Classification
Type
D - Article in proceedings
CEP classification
BE - Theoretical physics
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)
Others
Publication year
2009
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
IEEE Workshop Králíky 2009
ISBN
978-80-214-3938-2
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
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Publisher name
Neuveden
Place of publication
Neuveden
Event location
Králíky
Event date
Aug 31, 2009
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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