Reliability of Electronic Devices: Failure Mechanisms and Testing

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU81969" target="_blank" >RIV/00216305:26220/09:PU81969 - isvavai.cz</a>

Result on the web

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DOI - Digital Object Identifier

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Result language

angličtina

Original language name

Reliability of Electronic Devices: Failure Mechanisms and Testing

Original language description

Non-destructive methods for the quality characterization and reliability prediction of electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, electro-ultrasonic spectroscopy and acoustic emission. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicator for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signalscan be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component

Czech name

Reliability of Electronic Devices: Failure Mechanisms and Testing

Czech description

Non-destructive methods for the quality characterization and reliability prediction of electronic devices are based on the VA characteristics, the nonlinearity index (NLI), electronic noise spectroscopy, electro-ultrasonic spectroscopy and acoustic emission. Leakage current value and its dependence on ageing time for the fixed temperature and applied voltage are frequently used as the reliability indicator for tantalum and niobium capacitors. It is shown that the self-healing processes can regenerate capacitor structure and then leakage current and noise decrease in affected samples. The frequency dependence of the noise spectral density in mHz region gives the information on slow irreversible processes. Acoustic emission and partial discharges signalscan be used to localise the defect position in the foil capacitors. A noise and nonlinearity of resistors are used for detecting imperfections and abnormalities. It is shown that electro-ultrasonic spectroscopy intermodulation component

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

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Project

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Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year

2009

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

Reliability, risk and safety

ISBN

978-0-415-55509-8

ISSN

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e-ISSN

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Number of pages

12

Pages from-to

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Publisher name

Taylor&Francis Group, London UK

Place of publication

Great Britain

Event location

Praha

Event date

Sep 7, 2009

Type of event by nationality

WRD - Celosvětová akce

UT code for WoS article

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