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New Facts from lead-free Solders Reliability Investigation

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F09%3APU83364" target="_blank" >RIV/00216305:26220/09:PU83364 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    New Facts from lead-free Solders Reliability Investigation

  • Original language description

    There are done many research works following investigation of lead-free solders, and differently results are achieved for identical solder materials. The reason is simple, the same solder compound can show diverse results when other material and processparameters are different. That is reason why we have addicted on investigation of some critical areas which has significant impact on solder joint reliability and lifetime. At length the soldering area should be divided in three principal parts that arematerials and components, process and equipments, and design and testing. Our actual research work at Brno University of Technology is focused on soldering process parameters impact on solder joint structure, on wetting angle changes in dependence on material/process parameters and on thermo mechanical strain of soldered joints.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    <a href="/en/project/GA102%2F09%2F1701" target="_blank" >GA102/09/1701: Research and Development of the New Soldering Principles for Increasing of Solder Joints Reliability</a><br>

  • Continuities

    Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2009

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    17th European Microelectronics and Packaging Conference

  • ISBN

    978-1-4244-4722-0

  • ISSN

  • e-ISSN

  • Number of pages

    6

  • Pages from-to

  • Publisher name

    IMAPS Italy

  • Place of publication

    Rimini, Italy

  • Event location

    Rimini

  • Event date

    Jun 15, 2009

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article