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PRACTICALLY USABLE QUINHYDRONE CHEMICAL PASSIVATION OF A SILICON SURFACE FOR SOLAR CELLS

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU86580" target="_blank" >RIV/00216305:26220/10:PU86580 - isvavai.cz</a>

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    PRACTICALLY USABLE QUINHYDRONE CHEMICAL PASSIVATION OF A SILICON SURFACE FOR SOLAR CELLS

  • Original language description

    This work deals with an examination of a different solution types for the chemical passivation of a silicon surface. Various solutions are tested on silicon wafers for their consequent comparison. The main purpose of this work is to find optimal solutionfor practical usage, which suits the requirements of a time stability and start-up velocity of passivation, reproducibility of the measurements and a possibility of a perfect cleaning of a passivating solution remains from a silicon surface, so that theparameters of a measured silicon wafer will not worsen and there will not be any contamination of the other wafers series in the production after a repetitive return of the measured wafer into the production process. This work confirms the drawbacks ofcommonly used iodine passivation and a method of an effective chemical passivation with a quinhydrone in methanol solution was suggested. The solution with a concentration of 0.07 mol /dm3 fulfils all required criteria. The work also conf

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Student EEICT 2010

  • ISBN

    978-80-214-4079-1

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

  • Publisher name

    Neuveden

  • Place of publication

    Brno

  • Event location

    FEKT VUT v Brně

  • Event date

    Apr 29, 2010

  • Type of event by nationality

    CST - Celostátní akce

  • UT code for WoS article