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Parametric Reduction of Jacobian Matrix for Fault Analysis

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F10%3APU88584" target="_blank" >RIV/00216305:26220/10:PU88584 - isvavai.cz</a>

  • Alternative codes found

    RIV/60162694:G43__/10:00421699

  • Result on the web

  • DOI - Digital Object Identifier

Alternative languages

  • Result language

    angličtina

  • Original language name

    Parametric Reduction of Jacobian Matrix for Fault Analysis

  • Original language description

    The paper deals with a fast numerical method for generating the Jacobian matrix of network function for large analog linear circuits. It is based on the use of cofactor matrices. The computational cost of the Jacobian is comparable to the cost of computing a single network function on selected frequencies. In addition, the method allows performing the reduction of Jacobian matrix based on large-change sensitivities in order to decrease the computational complexity of subsequent testability analysis. Anexample analysis of a frequency filter is presented.

  • Czech name

  • Czech description

Classification

  • Type

    D - Article in proceedings

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

    Result was created during the realization of more than one project. More information in the Projects tab.

  • Continuities

    P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Others

  • Publication year

    2010

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Article name in the collection

    Proc. of the 22nd IEEE International Conference on Microelectronics (ICM 2010)

  • ISBN

    978-1-61284-151-9

  • ISSN

  • e-ISSN

  • Number of pages

    4

  • Pages from-to

    503-506

  • Publisher name

    IEEE

  • Place of publication

    Cairo

  • Event location

    Cairo

  • Event date

    Dec 19, 2010

  • Type of event by nationality

    WRD - Celosvětová akce

  • UT code for WoS article

    000290617900127