Noise diagnostics of solar cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU93358" target="_blank" >RIV/00216305:26220/11:PU93358 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Noise diagnostics of solar cells
Original language description
PN junction is one of the most important parts of solar cells. Its quality affects lifetime and efficiency of solar cells. Local defects which appear in PN junctions during the manufacture process are very important from this point of view. Measuring method of narrow-band noise current RMS value with reverse bias junction were used in this paper. This method allows detection of local defects and volume degradation in PN junctions of solar cells and it can be used for detection of microplasma noise.
Czech name
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Czech description
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Project
<a href="/en/project/GAP102%2F10%2F2013" target="_blank" >GAP102/10/2013: Fluctuation processes in PN junctions of solar cells</a><br>
Continuities
Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 17th conference STUDENT EEICT 2010 volume 3
ISBN
978-80-214-4273-3
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
366-370
Publisher name
VUT v Brně
Place of publication
Brno
Event location
Brno
Event date
Apr 28, 2011
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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