Contribution to characterization of interdigital capacitors

Result code in IS VaVaI

<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU93595" target="_blank" >RIV/00216305:26220/11:PU93595 - isvavai.cz</a>

Result on the web

—

DOI - Digital Object Identifier

—

Result language

angličtina

Original language name

Contribution to characterization of interdigital capacitors

Original language description

This article deals with characterization of thick film interdigital capacitors, where attention is devoted to the influence of air gap width on capacitance. Air gap serves as dielectric and the scope of interest is dependence of the capacitance on air gap width.The set of interdigital capacitors was created with different air gap width.These capacitors were measured and result is evaluated in this article.

Czech name

—

Czech description

—

Type

D - Article in proceedings

CEP classification

JA - Electronics and optoelectronics

OECD FORD branch

—

Project

<a href="/en/project/FR-TI1%2F072" target="_blank" >FR-TI1/072: Use of Modern Assembly Techniques and Materials in Electronic Industry</a><br>

Continuities

Z - Vyzkumny zamer (s odkazem do CEZ)<br>S - Specificky vyzkum na vysokych skolach

Publication year

2011

Confidentiality

S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection

ISSE 2011 Conference Proceedings

ISBN

978-1-4577-2111-3

ISSN

—

e-ISSN

—

Number of pages

3

Pages from-to

50-52

Publisher name

Neuveden

Place of publication

Neuveden

Event location

Tatranská Lomnica

Event date

May 11, 2011

Type of event by nationality

EUR - Evropská akce

UT code for WoS article

—