Noise in Thick-Film Pressure Sensors

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F11%3APU95272" target="_blank" >RIV/00216305:26220/11:PU95272 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Noise in Thick-Film Pressure Sensors
Original language description
Industrial demand for high reliability of electronic devices stimulates research in the field of transport and noise phenomena in pressure sensors based on the thick conducting films. We are concentrating our effort on the use of low frequency noise as adiagnostic tool for the reliability improvement and sensitivity increase of the thick film pressure sensors. The recent development of some new technologies increases the interest for ceramic pressure sensors (CPS). One of these technologies is low-temperature co-fired ceramic (LTCC) technology. This technology and material in combination with conventional thick-film technology offers a feasible solution to increase the sensitivity of the pressure sensors and the flexibility in design, both with the intention to replace the silicon-based pressure sensor in some applications. Low frequency noise is a sensitive indicator of the presence of defects and imperfection in the structure. The measurements of the electronic noise level could be
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>Z - Vyzkumny zamer (s odkazem do CEZ)

Publication year
2011
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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