Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU105059" target="_blank" >RIV/00216305:26220/13:PU105059 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Noise and Local Diagnostics of Laser Notches on Silicon Solar Cells
Original language description
Paper deals with diagnostics of crystalline silicon solar cells with structures prepared by application of laser technologies. These laser-generated structures should help to isolate the edges of solar cells and also should isolate bulk defects. At the present we are trying to find the optimal parameters of laser processing. Laser parameters influencing how deep the laser notch is realized. We tried to determine what depth of the notch seems to be an ideal. Noise diagnostic methods are used for our study. These methods are based on the study of electrically measurable fluctuation quantities, especially electrical voltage and current, complemented by the transport characteristics. Electrical models describing behaviour of laser-prepared structures wereput forward. The study of optical near-field and far-field will be also realized. Measurement of local radiation from solar cells during electrical excitation were carried out.
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BM - Solid-state physics and magnetism
OECD FORD branch
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Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
2013 22nd International Conference on Noise and Fluctuations (ICNF), IEEE Catalog Number CFP1392N-USB
ISBN
978-1-4799-0670-3
ISSN
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e-ISSN
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Number of pages
4
Pages from-to
1-4
Publisher name
Neuveden
Place of publication
Montpellier
Event location
Montpellier, France
Event date
Jun 24, 2013
Type of event by nationality
WRD - Celosvětová akce
UT code for WoS article
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