The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F13%3APU106119" target="_blank" >RIV/00216305:26220/13:PU106119 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Result language
angličtina
Original language name
The Possibility of Capturing Shock Waves by Computer Simulation in Environmental Scanning Electron Microscope
Original language description
Environmental scanning electron microscope (ESEM) is one of the latest trends in microscopic methods. In this microscope, we can observe various types of specimens, especially non-conductive and wet specimens. This is given by high pressure of gas in thespecimen chamber. The evaluation of pressure on the secondary electrons trajectory is one of the important parameter in design of scintillation detector of secondary electrons. This article deals with computational modelling of pressure conditions and shock waves generation in the scintillation detector of secondary electrons for this type of microscope.
Czech name
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Czech description
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Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
BK - Liquid mechanics
OECD FORD branch
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Project
<a href="/en/project/ED0014%2F01%2F01" target="_blank" >ED0014/01/01: Research and Technology Centre of Renewable Energy Sources</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach

Publication year
2013
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

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