All

What are you looking for?

All
Projects
Results
Organizations

Quick search

  • Projects supported by TA ČR
  • Excellent projects
  • Projects with the highest public support
  • Current projects

Smart search

  • That is how I find a specific +word
  • That is how I leave the -word out of the results
  • “That is how I can find the whole phrase”

Progression of Silicon Solar Cells Luminescence Diagnostic Methods

The result's identifiers

  • Result code in IS VaVaI

    <a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU106616" target="_blank" >RIV/00216305:26220/14:PU106616 - isvavai.cz</a>

  • Result on the web

    <a href="http://www.hrpub.org/journals/jour_info.php?id=49" target="_blank" >http://www.hrpub.org/journals/jour_info.php?id=49</a>

  • DOI - Digital Object Identifier

    <a href="http://dx.doi.org/10.13189/ujeee.2014.020103" target="_blank" >10.13189/ujeee.2014.020103</a>

Alternative languages

  • Result language

    angličtina

  • Original language name

    Progression of Silicon Solar Cells Luminescence Diagnostic Methods

  • Original language description

    Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera withthose methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.

  • Czech name

  • Czech description

Classification

  • Type

    J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)

  • CEP classification

    JA - Electronics and optoelectronics

  • OECD FORD branch

Result continuities

  • Project

  • Continuities

    S - Specificky vyzkum na vysokych skolach

Others

  • Publication year

    2014

  • Confidentiality

    S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Data specific for result type

  • Name of the periodical

    Universal Journal of Electrical and Electronic Engineering

  • ISSN

    2332-3299

  • e-ISSN

  • Volume of the periodical

    2

  • Issue of the periodical within the volume

    1

  • Country of publishing house

    US - UNITED STATES

  • Number of pages

    5

  • Pages from-to

    18-22

  • UT code for WoS article

  • EID of the result in the Scopus database