Progression of Silicon Solar Cells Luminescence Diagnostic Methods
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU106616" target="_blank" >RIV/00216305:26220/14:PU106616 - isvavai.cz</a>
Result on the web
<a href="http://www.hrpub.org/journals/jour_info.php?id=49" target="_blank" >http://www.hrpub.org/journals/jour_info.php?id=49</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.13189/ujeee.2014.020103" target="_blank" >10.13189/ujeee.2014.020103</a>
Alternative languages
Result language
angličtina
Original language name
Progression of Silicon Solar Cells Luminescence Diagnostic Methods
Original language description
Diagnostic of silicon solar cells defects is permanently one of most important steps in production of solar cells. Specify of diagnostic methods leads to a better understanding and more detailed analysis of manufactured cells. Luminescence methods of solar cells are fast and some of the most common methods today. According to the excitation method of luminescence radiation from silicon solar cells we talk about electroluminescence or photoluminescence methods. Spectral response of using CCD camera withthose methods is in band-gap infrared wave length area. The main idea of this paper is to analyze emitted infrared radiation silicon solar cell under the forward bias by polarization spectroscopy. This analysis opens up for potential next new questions in diagnostics defects silicon solar cells by luminescence methods.
Czech name
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Czech description
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Classification
Type
J<sub>x</sub> - Unclassified - Peer-reviewed scientific article (Jimp, Jsc and Jost)
CEP classification
JA - Electronics and optoelectronics
OECD FORD branch
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Result continuities
Project
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Continuities
S - Specificky vyzkum na vysokych skolach
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Universal Journal of Electrical and Electronic Engineering
ISSN
2332-3299
e-ISSN
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Volume of the periodical
2
Issue of the periodical within the volume
1
Country of publishing house
US - UNITED STATES
Number of pages
5
Pages from-to
18-22
UT code for WoS article
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EID of the result in the Scopus database
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