Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F14%3APU117567" target="_blank" >RIV/00216305:26220/14:PU117567 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
Investigation Of Electron Beam Induced Mass Loss of Embedding Media in the Low Voltage STEM
Original language description
This paper deals with usage of a low voltage STEM for biological purposes. The investigation of electron beam induced mass loss of ultrathin sections of three embedding media is presented. The mass loss of the sample caused by the electron bombardment isnot examined in detail in the literature but it seems to be an important fact in investigation of biological samples by low voltage STEM. The samples of different thickness were investigated using different microscope settings (acceleration voltage, total dose, probe current, cleaning of the sample surface) and STEM imaging modes (bright-field, dark-field).
Czech name
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Czech description
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Classification
Type
D - Article in proceedings
CEP classification
BO - Biophysics
OECD FORD branch
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Result continuities
Project
<a href="/en/project/LO1210" target="_blank" >LO1210: Energy for Sustainable Development</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2014
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Article name in the collection
Student EEICT - Proceedings of the 20th conference
ISBN
978-80-214-4923-7
ISSN
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e-ISSN
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Number of pages
288
Pages from-to
139-141
Publisher name
LITERA
Place of publication
Brno
Event location
Brno
Event date
Apr 24, 2014
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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