Characterizing SiC-AlN semiconductor solid solutions with indirect and direct bandgaps
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F15%3APU112292" target="_blank" >RIV/00216305:26220/15:PU112292 - isvavai.cz</a>
Result on the web
<a href="http://dx.doi.org/10.1117/12.2070352" target="_blank" >http://dx.doi.org/10.1117/12.2070352</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1117/12.2070352" target="_blank" >10.1117/12.2070352</a>
Alternative languages
Result language
angličtina
Original language name
Characterizing SiC-AlN semiconductor solid solutions with indirect and direct bandgaps
Original language description
The objective of the study is dependence of optical properties of solid solution of silicon carbide and aluminum nitride on structure. Even small differences in composition provide manipulation of band gap features in wide range. Data for this paper were collected by X-ray diffraction and by study of photoluminescence and absorption spectra. Evolution of optical properties as a result of composition changing was studied. X-ray study proves the presence of (SiC)1-x(AlN)x solid solution. Investigation of absorption spectra shows that optical band gap of the sample with composition of (SiC)0,88(AlN)0,12 is 3.1 eV and 4.24 eV for (SiC)0,36(AlN)0,64 solid solution. Photoluminescence demonstrates strongly dependence of spectrum on x concentration. The results are in mutual agrement and correspond to the therory. These data allows optimization of optical properties for certain optoelectronic application by control of the (SiC)1-x(AlN)x composition
Czech name
—
Czech description
—
Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
—
OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
Proceedings of SPIE
ISSN
0277-786X
e-ISSN
—
Volume of the periodical
9450
Issue of the periodical within the volume
9450
Country of publishing house
US - UNITED STATES
Number of pages
6
Pages from-to
„94501R-1“-„94501R-6“
UT code for WoS article
000349404500061
EID of the result in the Scopus database
2-s2.0-84923036749