Current Fluctuations of Reverse-Biased Solar Cells

Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F15%3APU114668" target="_blank" >RIV/00216305:26220/15:PU114668 - isvavai.cz</a>
Result on the web
<a href="http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf" target="_blank" >http://www.feec.vutbr.cz/EEICT/2015/sbornik/EEICT-2015-sbornik-komplet_v2.pdf</a>
DOI - Digital Object Identifier
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Result language
angličtina
Original language name
Current Fluctuations of Reverse-Biased Solar Cells
Original language description
This paper presents mainly noise diagnostics of pn junctions local defects in a single-crystalline silicon solar cells structure. Research consists of a non-destructive measurement methodology of reverse-biased junction in solar cells. Diagnostics of defect areas in this documents are based especially on measurement of noise power spectral density, measurement of the radiation emitted from defects in visible range and I-V characteristic measurement.
Czech name
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Czech description
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Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)

Publication year
2015
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů

Article name in the collection
Proceedings of the 21st Conference STUDENT EEICT 201
ISBN
978-80-214-5148-3
ISSN
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e-ISSN
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Number of pages
5
Pages from-to
546-550
Publisher name
Vysoké učení technické v Brně, Fakulta elektrotechniky a komunikačních technologií
Place of publication
Brno
Event location
Brno
Event date
Apr 23, 2015
Type of event by nationality
CST - Celostátní akce
UT code for WoS article
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