A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU123224" target="_blank" >RIV/00216305:26220/17:PU123224 - isvavai.cz</a>
Result on the web
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DOI - Digital Object Identifier
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Alternative languages
Result language
angličtina
Original language name
A method for in-situ measurement of TID induced degradation in measurement accuracy of high-resolution ADCs
Original language description
This work presents a test method that allows in-situ measurements of radiation-induced changes in measurement accuracy of high resolution analog to digital converters. These converters are typically used in the data acquisition system of scientific instruments for space missions. The results of the radiation experiments on various commercial converters will be presented and discussed. The influence on the DC accuracy and integral non-linearity will be covered.
Czech name
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Czech description
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Classification
Type
O - Miscellaneous
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
<a href="/en/project/LO1401" target="_blank" >LO1401: Interdisciplinary Research of Wireless Technologies</a><br>
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)<br>S - Specificky vyzkum na vysokych skolach
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů