Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters
The result's identifiers
Result code in IS VaVaI
<a href="https://www.isvavai.cz/riv?ss=detail&h=RIV%2F00216305%3A26220%2F17%3APU124064" target="_blank" >RIV/00216305:26220/17:PU124064 - isvavai.cz</a>
Result on the web
<a href="https://link.springer.com/article/10.1007/s10854-017-7422-4" target="_blank" >https://link.springer.com/article/10.1007/s10854-017-7422-4</a>
DOI - Digital Object Identifier
<a href="http://dx.doi.org/10.1007/s10854-017-7422-4" target="_blank" >10.1007/s10854-017-7422-4</a>
Alternative languages
Result language
angličtina
Original language name
Micromorphology investigation of GaAs solar cells: case study on statistical surface roughness parameters
Original language description
The purpose of this work is surface characterization of GaAs solar cell using atomic force microscopy. The surface appearance influences the optical properties of the cells. It impacts light trapping and consequently affect the efficiency of the solar cells. In case of nano-structural surface, the properties are strongly depends on its geometrical characteristics. Surface appearance was studied by atomic force microscopy (AFM). Fractal analysis was done by the triangulation method and evaluation of statistical metrics was carrying out on the basis of AFM-data, before and after heating. The results of fractal analysis show the correlation of fractal dimension and statistical characteristics of surface topography. Characterization technique and data processing methodology are essential for description of the surface condition.
Czech name
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Czech description
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Classification
Type
J<sub>imp</sub> - Article in a specialist periodical, which is included in the Web of Science database
CEP classification
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OECD FORD branch
20201 - Electrical and electronic engineering
Result continuities
Project
Result was created during the realization of more than one project. More information in the Projects tab.
Continuities
P - Projekt vyzkumu a vyvoje financovany z verejnych zdroju (s odkazem do CEP)
Others
Publication year
2017
Confidentiality
S - Úplné a pravdivé údaje o projektu nepodléhají ochraně podle zvláštních právních předpisů
Data specific for result type
Name of the periodical
JOURNAL OF MATERIALS SCIENCE-MATERIALS IN ELECTRONICS
ISSN
0957-4522
e-ISSN
1573-482X
Volume of the periodical
28
Issue of the periodical within the volume
15
Country of publishing house
NL - THE KINGDOM OF THE NETHERLANDS
Number of pages
12
Pages from-to
1-12
UT code for WoS article
000412157300058
EID of the result in the Scopus database
2-s2.0-85021801778